

Peifeng Tunan salutes the Chip Innovation Contest
A hundred chips contend—sparking fresh R&D ideas; fertile ground for talent forges a new ‘chip’ frontier for the industry - On July 30, the eighth “Huawei Cup” National Finals of the China Graduate Innovation Competition successfully concluded at the Suzhou campus of Nanjing University. Graduate teams from numerous universities nationwide gathered to showcase their exceptional innovation potential and research capabilities at this chip event, which integrated deep thinking, advanced technology, and practical applications.

Mozz TCAD 2025.04 Released
The first TCAD suite in China to support complete 3D process and 3D device simulation

Total Ionizing Dose Effect in CMOS
Total Ionizing Dose (TID) effect is one of the prominent effects on irradiated semiconductor devices