Compact Modeling

Compact modeling is an essential step in modern IC design flow that links circuit design, device and processing technology. Our modeling tools and services cover a wide range of devices and technologies, including CMOS, RF, BCD, discrete power, and emerging technologies like GaN and SiC ICs, active and passive devices, and specialty features such as statistical model, noise model and aging model.

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CMOS Compact Modeling

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With a well-established modeling and QA workflow, compact modeling for CMOS and FinFET technologies are executed efficiently with the highest quality standard.

  • Devices
    • Active and passive devices
    • Global or binning model
    • Layout-dependent effects
    • Corner models
    • Statistical models for global and local variations
    • Noise model
    • Aging model
  • Parasitics
    • Parasitic resistances and capacitances
    • Multiple PEX flows
    • Etch bias and thickness variation
    • Corner models
    • EMIR solution
  • Testing
    • Device characterization for modeling
    • 12" and 8" auto-probers (-40~125°C)
    • Fully automated precision instruments (SMU and LCR)

Aging Model

The traditional, conservative approach to reliability is becoming inadequate while we push designs to the limit. Accurate aging analysis is not only needed to achieve competitive advantage, it is also needed to fulfill new applications requirements such as 2.5D and 3D integration, automotive and data-center.

We offer reliability characterization and aging model services in response to the demand for advanced aging analysis.

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